Activity

From 06/07/2018 to 07/06/2018

07/06/2018

09:42 PM Analyzing #207: Particle identification plot for left telescope

Analysis of the 6He beam data

For convenience, we show uncorrected part of dE-E plot as shown in task 186.

Un...

Vratislav Chudoba
04:04 PM Analyzing #207 (Открыта): Particle identification plot for left telescope

Identification of particles using dE-E plot is difficult because of unclarity related to thin detector thickness.

...

Vratislav Chudoba

06/25/2018

03:02 PM Analyzing #199: Determination of positions of silicone detectors

The orientation thin detector in the thick detector with taking into account possible errors. The center points of th...

Bahytbek Mauyey

06/24/2018

02:13 AM Analyzing #186: Number of 3He coincidences with 3H

We worked with run14 of exposition on 6He beam saved in lmd files:

XXX

Scripts for data treatment are availab...

Vratislav Chudoba

06/19/2018

05:02 PM Analyzing #198 (Закрыта): Determination of thickness inhomogeneity of thin silicon detector

Ivan Muzalevsky

06/18/2018

06:20 PM Analyzing #186: Number of 3He coincidences with 3H

Analysis of data with beryllium beam gives interesting results. Data

mbsdaq@nra161:/LynxOS/mbsusr/mbsdaq/mbsru...

Vratislav Chudoba

06/16/2018

03:50 AM Analyzing #186: Number of 3He coincidences with 3H

We compared dE-E identification plots obtained from experimental data (run 14) with data used for calibrations giving...

Vratislav Chudoba

06/15/2018

02:13 AM Analyzing #183: Express analysis of experimental data

Raw data may be converted into ROOT format in following way:

Go4 library must be available. One of the well w...

Vratislav Chudoba
11:02 AM Analyzing #195 (Закрыта): First estimate of inhomogeneity of thin Si detector

Phenomena was studied deeply in issue 198.

Ivan Muzalevsky

06/14/2018

02:26 PM Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

the same macros was used for determination of thickness of 20um det, but this time each SQY_L strips was separated in...

Ivan Muzalevsky

06/07/2018

02:11 PM Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

I have contacted the Micron Semiconductors. There is no input control of the thickness uniformity. They rely only upo...

Sergey Belogurov
01:58 PM Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

files 159.93.80.161:/LynxOS/mbsusr/mbsdaq/mbsrun/exp201804/data/calib/si_after/si-1_si-20_35cm_0deg_new1_*.lmd were p...

Ivan Muzalevsky
11:48 AM Developing #187: Калибрация 1 мм кремневого детектора

 

For data obtained in measurements with SQL, by irradiating it from 35 cm with 90 and 45 angle. In this measureme...

Ivan Muzalevsky
 

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