Ivan Muzalevsky's activity

From 05/28/2018 to 06/26/2018

06/19/2018

05:02 PM EXP1803 Analyzing #198 (Закрыта): Determination of thickness inhomogeneity of thin silicon detector

Ivan Muzalevsky

06/15/2018

11:02 AM EXP1803 Analyzing #195 (Закрыта): First estimate of inhomogeneity of thin Si detector

Phenomena was studied deeply in issue 198.

Ivan Muzalevsky

06/14/2018

02:26 PM EXP1803 Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

the same macros was used for determination of thickness of 20um det, but this time each SQY_L strips was separated in...

Ivan Muzalevsky

06/07/2018

01:58 PM EXP1803 Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

files 159.93.80.161:/LynxOS/mbsusr/mbsdaq/mbsrun/exp201804/data/calib/si_after/si-1_si-20_35cm_0deg_new1_*.lmd were p...

Ivan Muzalevsky
11:48 AM EXP1803 Developing #187: Калибрация 1 мм кремневого детектора

 

For data obtained in measurements with SQL, by irradiating it from 35 cm with 90 and 45 angle. In this measureme...

Ivan Muzalevsky

06/06/2018

12:08 PM EXP1803 Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

In data 159.93.80.161:/LynxOS/mbsusr/mbsdaq/mbsrun/exp201804/data/calib/si_after/si-1_si-20_35cm_0deg_new1_*.lmd ther...

Ivan Muzalevsky

06/04/2018

12:36 PM EXP1803 Developing #184: Калибрация тонково кремневого детектора

From the data obtained in meauserements described in task 197 dead layer was calculated. calculations was made https:...

Ivan Muzalevsky
11:55 AM EXP1803 Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

In order to analyse the properties last strips (12-15) data from measurements, where alpha source was moved to the le...

Ivan Muzalevsky

06/01/2018

10:37 AM EXP1803 Developing #197: Measurement of thickness of thin silicon detector

Several measurements were carried out. In all of them two detectors were used. 20 mcm (discription see in file 7306 r...

Ivan Muzalevsky

05/30/2018

04:56 PM EXP1803 Analyzing #198: Determination of thickness inhomogeneity of thin silicon detector

data from the files 159.93.80.161:/LynxOS/mbsusr/mbsdaq/mbsrun/exp201804/data/calib/si_after/si-1_si-20_35cm_45deg_ne...

Ivan Muzalevsky
 

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